| |
| 2003 | ||
|---|---|---|
| 1 | EE | Cezary Sydlo, K. Mutamba, L. Divac Krnic, Bastian Mottet, Hans L. Hartnagel: Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress. Microelectronics Reliability 43(9-11): 1929-1933 (2003) |
| 1 | Hans L. Hartnagel | [1] |
| 2 | L. Divac Krnic | [1] |
| 3 | Bastian Mottet | [1] |
| 4 | Cezary Sydlo | [1] |