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S. L. Delage

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2005
3EEA. Sozza, C. Dua, E. Morvan, B. Grimber, S. L. Delage: A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectronics Reliability 45(9-11): 1617-1621 (2005)
2003
2EES. L. Delage, C. Dua: Wide band gap semiconductor reliability : Status and trends. Microelectronics Reliability 43(9-11): 1705-1712 (2003)
2001
1 Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, S. L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectronics Reliability 41(9-10): 1567-1571 (2001)

Coauthor Index

1Steven Bland [1]
2Simone Cassette [1]
3Eric Chartier [1]
4C. Dua [2] [3]
5D. Floriot [1]
6Husin Ganis [1]
7B. Grimber [3]
8Hans L. Hartnagel [1]
9Viktor Krozer [1]
10E. Morvan [3]
11Bastian Mottet [1]
12A. Sozza [3]
13Cezary Sydlo [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)