| 2005 |
|---|
| 3 | EE | A. Sozza,
C. Dua,
E. Morvan,
B. Grimber,
S. L. Delage:
A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications.
Microelectronics Reliability 45(9-11): 1617-1621 (2005) |
| 2003 |
|---|
| 2 | EE | S. L. Delage,
C. Dua:
Wide band gap semiconductor reliability : Status and trends.
Microelectronics Reliability 43(9-11): 1705-1712 (2003) |
| 2001 |
|---|
| 1 | | Cezary Sydlo,
Bastian Mottet,
Husin Ganis,
Hans L. Hartnagel,
Viktor Krozer,
S. L. Delage,
Simone Cassette,
Eric Chartier,
D. Floriot,
Steven Bland:
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Microelectronics Reliability 41(9-10): 1567-1571 (2001) |
