| |
| 2002 | ||
|---|---|---|
| 1 | EE | Cezary Sydlo, M. Saglam, Bastian Mottet, M. Rodríguez-Gironés, Hans L. Hartnagel: Reliability investigations on HBV using pulsed electrical stress. Microelectronics Reliability 42(9-11): 1563-1568 (2002) |
| 1 | Hans L. Hartnagel | [1] |
| 2 | Bastian Mottet | [1] |
| 3 | M. Rodríguez-Gironés | [1] |
| 4 | Cezary Sydlo | [1] |