| |
| 2002 | ||
|---|---|---|
| 2 | EE | Cezary Sydlo, M. Saglam, Bastian Mottet, M. Rodríguez-Gironés, Hans L. Hartnagel: Reliability investigations on HBV using pulsed electrical stress. Microelectronics Reliability 42(9-11): 1563-1568 (2002) |
| 1 | EE | V. Ichizli, M. Rodríguez-Gironés, L. Marchand, C. Garden, O. Cojocari, Bastian Mottet, Hans L. Hartnagel: Process Control and Failure Analysis Implementation for THz Schottky-based components. Microelectronics Reliability 42(9-11): 1593-1596 (2002) |
| 1 | O. Cojocari | [1] |
| 2 | C. Garden | [1] |
| 3 | Hans L. Hartnagel | [1] [2] |
| 4 | V. Ichizli | [1] |
| 5 | L. Marchand | [1] |
| 6 | Bastian Mottet | [1] [2] |
| 7 | M. Saglam | [2] |
| 8 | Cezary Sydlo | [2] |