| |
| 2001 | ||
|---|---|---|
| 1 | Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, S. L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectronics Reliability 41(9-10): 1567-1571 (2001) | |
| 1 | Steven Bland | [1] |
| 2 | Eric Chartier | [1] |
| 3 | S. L. Delage | [1] |
| 4 | D. Floriot | [1] |
| 5 | Husin Ganis | [1] |
| 6 | Hans L. Hartnagel | [1] |
| 7 | Viktor Krozer | [1] |
| 8 | Bastian Mottet | [1] |
| 9 | Cezary Sydlo | [1] |