| 2006 |
|---|
| 4 | EE | Masayasu Fukunaga,
Seiji Kajihara,
Xiaoqing Wen,
Toshiyuki Maeda,
Shuji Hamada,
Yasuo Sato:
A dynamic test compaction procedure for high-quality path delay testing.
ASP-DAC 2006: 348-353 |
| 3 | EE | Yasuo Sato,
Shuji Hamada,
Toshiyuki Maeda,
Atsuo Takatori,
Seiji Kajihara:
A Statistical Quality Model for Delay Testing.
IEICE Transactions 89-C(3): 349-355 (2006) |
| 2005 |
|---|
| 2 | EE | Yasuo Sato,
Shuji Hamada,
Toshiyuki Maeda,
Atsuo Takatori,
Seiji Kajihara:
Evaluation of the statistical delay quality model.
ASP-DAC 2005: 305-310 |
| 1 | EE | Seiji Kajihara,
Masayasu Fukunaga,
Xiaoqing Wen,
Toshiyuki Maeda,
Shuji Hamada,
Yasuo Sato:
Path delay test compaction with process variation tolerance.
DAC 2005: 845-850 |
