| 2004 |
|---|
| 6 | EE | Juan Santana,
Magali Estrada,
Ofelia Martinez:
Editorial.
Microelectronics Reliability 44(4): 649 (2004) |
| 2003 |
|---|
| 5 | EE | Magali Estrada,
A. Afzalian,
Denis Flandre,
Antonio Cerdeira,
H. Baez,
A. de Lucca:
FD MOS SOI circuit to enhance the ratio of illuminated to dark current of a co-integrated a-Si: H photodiode.
Microelectronics Reliability 43(2): 189-193 (2003) |
| 4 | EE | J. C. Tinoco,
Magali Estrada,
G. Romero:
Room temperature plasma oxidation mechanism to obtain ultrathin silicon oxide and titanium oxide layers.
Microelectronics Reliability 43(6): 895-903 (2003) |
| 3 | EE | R. García,
Magali Estrada,
Antonio Cerdeira:
Effects of impurity concentration, hydrogen plasma process and crystallization temperature on poly-crystalline films obtained from PECVD a-Si: H layers.
Microelectronics Reliability 43(8): 1281-1287 (2003) |
| 2002 |
|---|
| 2 | EE | Adelmo Ortiz-Conde,
F. J. García Sánchez,
Juin J. Liou,
Antonio Cerdeira,
Magali Estrada,
Y. Yue:
A review of recent MOSFET threshold voltage extraction methods.
Microelectronics Reliability 42(4-5): 583-596 (2002) |
| 2001 |
|---|
| 1 | EE | Magali Estrada,
Antonio Cerdeira,
Adelmo Ortiz-Conde,
Francisco García:
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction.
Microelectronics Reliability 41(4): 605-610 (2001) |
