| 2006 |
|---|
| 4 | EE | A. Sozza,
A. Curutchet,
C. Dua,
N. Malbert,
N. Labat,
A. Touboul:
AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements.
Microelectronics Reliability 46(9-11): 1725-1730 (2006) |
| 2005 |
|---|
| 3 | EE | A. Sozza,
C. Dua,
E. Morvan,
B. Grimber,
S. L. Delage:
A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications.
Microelectronics Reliability 45(9-11): 1617-1621 (2005) |
| 2004 |
|---|
| 2 | EE | A. Sozza,
C. Dua,
A. Kerlain,
C. Brylinski,
E. Zanoni:
Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET.
Microelectronics Reliability 44(7): 1109-1113 (2004) |
| 2003 |
|---|
| 1 | EE | S. L. Delage,
C. Dua:
Wide band gap semiconductor reliability : Status and trends.
Microelectronics Reliability 43(9-11): 1705-1712 (2003) |
