| |
| 2005 | ||
|---|---|---|
| 2 | EE | A. Kerlain, V. Mosser: Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices. Microelectronics Reliability 45(9-11): 1327-1330 (2005) |
| 2004 | ||
| 1 | EE | A. Sozza, C. Dua, A. Kerlain, C. Brylinski, E. Zanoni: Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET. Microelectronics Reliability 44(7): 1109-1113 (2004) |
| 1 | C. Brylinski | [1] |
| 2 | C. Dua | [1] |
| 3 | V. Mosser | [2] |
| 4 | A. Sozza | [1] |
| 5 | E. Zanoni | [1] |