| |
| 2005 | ||
|---|---|---|
| 1 | EE | A. Sozza, C. Dua, E. Morvan, B. Grimber, S. L. Delage: A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectronics Reliability 45(9-11): 1617-1621 (2005) |
| 1 | S. L. Delage | [1] |
| 2 | C. Dua | [1] |
| 3 | B. Grimber | [1] |
| 4 | A. Sozza | [1] |