C. Brylinski

2004
1	EE	A. Sozza, C. Dua, A. Kerlain, C. Brylinski, E. Zanoni: Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET. Microelectronics Reliability 44(7): 1109-1113 (2004)

Coauthor Index

1	C. Dua	[1]
2	A. Kerlain	[1]
3	A. Sozza	[1]
4	E. Zanoni	[1]