| 2006 |
|---|
| 6 | EE | P. Cova,
Roberto Menozzi,
M. Portesine:
Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design.
Microelectronics Journal 37(5): 409-416 (2006) |
| 5 | EE | P. Cova,
N. Delmonte,
Roberto Menozzi:
Thermal characterization and modeling of power hybrid converters for distributed power systems.
Microelectronics Reliability 46(9-11): 1760-1765 (2006) |
| 2005 |
|---|
| 4 | EE | P. Cova,
N. Delmonte,
Roberto Menozzi:
On state breakdown in PHEMTs and its temperature dependence.
Microelectronics Reliability 45(9-11): 1605-1610 (2005) |
| 2003 |
|---|
| 3 | EE | P. Cova,
Roberto Menozzi,
M. Portesine:
Power p-i-n diodes for snubberless application: H+ irradiation for soft and reliable reverse recovery.
Microelectronics Reliability 43(1): 81-87 (2003) |
| 2002 |
|---|
| 2 | EE | P. Cova,
Roberto Menozzi,
M. Dammann,
T. Feltgen,
W. Jantz:
High-field step-stress and long term stability of PHEMTs with different gate and recess lengths.
Microelectronics Reliability 42(9-11): 1587-1592 (2002) |
| 1 | EE | Mauro Ciappa,
Flavio Carbognani,
P. Cova,
Wolfgang Fichtner:
A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors.
Microelectronics Reliability 42(9-11): 1653-1658 (2002) |
