2006 | ||
---|---|---|
2 | EE | P. Cova, Roberto Menozzi, M. Portesine: Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design. Microelectronics Journal 37(5): 409-416 (2006) |
2003 | ||
1 | EE | P. Cova, Roberto Menozzi, M. Portesine: Power p-i-n diodes for snubberless application: H+ irradiation for soft and reliable reverse recovery. Microelectronics Reliability 43(1): 81-87 (2003) |
1 | P. Cova | [1] [2] |
2 | Roberto Menozzi | [1] [2] |