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M. Portesine

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2006
2EEP. Cova, Roberto Menozzi, M. Portesine: Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design. Microelectronics Journal 37(5): 409-416 (2006)
2003
1EEP. Cova, Roberto Menozzi, M. Portesine: Power p-i-n diodes for snubberless application: H+ irradiation for soft and reliable reverse recovery. Microelectronics Reliability 43(1): 81-87 (2003)

Coauthor Index

1P. Cova [1] [2]
2Roberto Menozzi [1] [2]

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