| 2004 |
|---|
| 3 | EE | M. Dammann,
A. Leuther,
Rüdiger Quay,
M. Meng,
H. Konstanzer,
W. Jantz,
Michael Mikulla:
Reliability of 70 nm metamorphic HEMTs.
Microelectronics Reliability 44(6): 939-943 (2004) |
| 2002 |
|---|
| 2 | EE | M. Dammann,
F. Benkhelifa,
M. Meng,
W. Jantz:
Reliability of Metamorphic HEMTs for Power Applications.
Microelectronics Reliability 42(9-11): 1569-1573 (2002) |
| 1 | EE | P. Cova,
Roberto Menozzi,
M. Dammann,
T. Feltgen,
W. Jantz:
High-field step-stress and long term stability of PHEMTs with different gate and recess lengths.
Microelectronics Reliability 42(9-11): 1587-1592 (2002) |
