| |
| 2002 | ||
|---|---|---|
| 1 | EE | P. Cova, Roberto Menozzi, M. Dammann, T. Feltgen, W. Jantz: High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. Microelectronics Reliability 42(9-11): 1587-1592 (2002) |
| 1 | P. Cova | [1] |
| 2 | M. Dammann | [1] |
| 3 | W. Jantz | [1] |
| 4 | Roberto Menozzi | [1] |