| |
| 2001 | ||
|---|---|---|
| 1 | John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly: Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. ITC 2001: 258-267 | |
| 1 | John T. Chen | [1] |
| 2 | Jitendra Khare | [1] |
| 3 | Wojciech Maly | [1] |
| 4 | Janusz Rajski | [1] |
| 5 | Saghir A. Shaikh | [1] |