2008 |
5 | EE | Melanie Elm,
Hans-Joachim Wunderlich,
Michael E. Imhof,
Christian G. Zoellin,
Jens Leenstra,
Nicolas Mäding:
Scan chain clustering for test power reduction.
DAC 2008: 828-833 |
4 | EE | Michael A. Kochte,
Christian G. Zoellin,
Michael E. Imhof,
Hans-Joachim Wunderlich:
Test Set Stripping Limiting the Maximum Number of Specified Bits.
DELTA 2008: 581-586 |
2007 |
3 | EE | Michael E. Imhof,
Christian G. Zoellin,
Hans-Joachim Wunderlich,
Nicolas Mäding,
Jens Leenstra:
Scan Test Planning for Power Reduction.
DAC 2007: 521-526 |
2 | EE | Sybille Hellebrand,
Christian G. Zoellin,
Hans-Joachim Wunderlich,
Stefan Ludwig,
Torsten Coym,
Bernd Straube:
A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction.
DFT 2007: 50-58 |
2005 |
1 | EE | Arthur A. Bright,
Ruud A. Haring,
Marc Boris Dombrowa,
Martin Ohmacht,
Dirk Hoenicke,
Sarabjeet Singh,
James A. Marcella,
Robert F. Lembach,
Steve M. Douskey,
Matthew R. Ellavsky,
Christian G. Zoellin,
Alan Gara:
Blue Gene/L compute chip: Synthesis, timing, and physical design.
IBM Journal of Research and Development 49(2-3): 277-288 (2005) |