| |
| 2008 | ||
|---|---|---|
| 2 | EE | Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding: Scan chain clustering for test power reduction. DAC 2008: 828-833 |
| 1 | EE | Melanie Elm, Hans-Joachim Wunderlich: Scan Chain Organization for Embedded Diagnosis. DATE 2008: 468-473 |
| 1 | Michael E. Imhof | [2] |
| 2 | Jens Leenstra | [2] |
| 3 | Nicolas Mäding | [2] |
| 4 | Hans-Joachim Wunderlich | [1] [2] |
| 5 | Christian G. Zoellin | [2] |