| 2008 |
|---|
| 3 | EE | Melanie Elm,
Hans-Joachim Wunderlich,
Michael E. Imhof,
Christian G. Zoellin,
Jens Leenstra,
Nicolas Mäding:
Scan chain clustering for test power reduction.
DAC 2008: 828-833 |
| 2 | EE | Michael A. Kochte,
Christian G. Zoellin,
Michael E. Imhof,
Hans-Joachim Wunderlich:
Test Set Stripping Limiting the Maximum Number of Specified Bits.
DELTA 2008: 581-586 |
| 2007 |
|---|
| 1 | EE | Michael E. Imhof,
Christian G. Zoellin,
Hans-Joachim Wunderlich,
Nicolas Mäding,
Jens Leenstra:
Scan Test Planning for Power Reduction.
DAC 2007: 521-526 |
