| 2007 |
|---|
| 7 | EE | Charles H.-P. Wen,
Li-C. Wang,
Jayanta Bhadra:
An incremental learning framework for estimating signal controllability in unit-level verification.
ICCAD 2007: 250-257 |
| 2006 |
|---|
| 6 | EE | Onur Guzey,
Charles H.-P. Wen,
Li-C. Wang,
Tao Feng,
Hillel Miller,
Magdy S. Abadir:
Extracting a Simplified View of Design Functionality Based on Vector Simulation.
Haifa Verification Conference 2006: 34-49 |
| 5 | EE | Charles H.-P. Wen,
Onur Guzey,
Li-C. Wang:
Simulation-based functional test justification using a decision-digram-based Boolean data miner.
ICCD 2006 |
| 4 | EE | Charles H.-P. Wen,
Li-C. Wang,
Kwang-Ting Cheng:
Simulation-Based Functional Test Generation for Embedded Processors.
IEEE Trans. Computers 55(11): 1335-1343 (2006) |
| 2005 |
|---|
| 3 | EE | Leonard Lee,
Sean Wu,
Charles H.-P. Wen,
Li-C. Wang:
On Generating Tests to Cover Diverse Worst-Case Timing Corners.
DFT 2005: 415-426 |
| 2 | EE | Charles H.-P. Wen,
Li-C. Wang:
Simulation Data Mining for Functional Test Pattern Justification.
MTV 2005: 76-83 |
| 1 | EE | Charles H.-P. Wen,
Li-C. Wang,
Kwang-Ting Cheng,
Kai Yang,
Wei-Ting Liu,
Ji-Jan Chen:
On A Software-Based Self-Test Methodology and Its Application.
VTS 2005: 107-113 |
