Hans vanMeer

2009
1	EE	Akif Sultan, John Faricelli, Sushant Suryagandh, Hans vanMeer, Kaveri Mathur, James Pattison, Sean Hannon, Greg Constant, Kalyana Kumar, Kevin Carrejo, Joe Meier, Rasit Onur Topaloglu, Darin Chan, Uwe Hahn, Thorsten Knopp, Victor Andrade, Bill Gardiol, Steve Hejl, David Wu, James Buller, Larry Bair, Ali Icel, Yuri Apanovich: CAD utilities to comprehend layout-dependent stress effects in 45 nm high- performance SOI custom macro design. ISQED 2009: 442-446

Coauthor Index

1	Victor Andrade	[1]
2	Yuri Apanovich	[1]
3	Larry Bair	[1]
4	James Buller	[1]
5	Kevin Carrejo	[1]
6	Darin Chan	[1]
7	Greg Constant	[1]
8	John Faricelli	[1]
9	Bill Gardiol	[1]
10	Uwe Hahn	[1]
11	Sean Hannon	[1]
12	Steve Hejl	[1]
13	Ali Icel	[1]
14	Thorsten Knopp	[1]
15	Kalyana Kumar	[1]
16	Kaveri Mathur	[1]
17	Joe Meier	[1]
18	James Pattison	[1]
19	Akif Sultan	[1]
20	Sushant Suryagandh	[1]
21	Rasit Onur Topaloglu	[1]
22	David Wu	[1]