Tooru Honzawa

1998
1	EE	Xiaoqing Wen, Tooru Honzawa, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: Design for Diagnosability of CMOS Circuits. Asian Test Symposium 1998: 144-149

Coauthor Index

1	Kozo Kinoshita	[1]
2	Kewal K. Saluja	[1]
3	Hideo Tamamoto	[1]
4	Xiaoqing Wen	[1]