Ninoslav Stojadinovic

2006
12	EE	D. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic: NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectronics Reliability 46(9-11): 1828-1833 (2006)
2005
11	EE	Ninoslav Stojadinovic, I. Manic, V. Davidovic, D. Dankovic, S. Djoric-Veljkovic, S. Golubovic, S. Dimitrijev: Effects of electrical stressing in power VDMOSFETs. Microelectronics Reliability 45(1): 115-122 (2005)
10	EE	Ninoslav Stojadinovic, D. Dankovic, S. Djoric-Veljkovic, V. Davidovic, I. Manic, S. Golubovic: Negative bias temperature instability mechanisms in p-channel power VDMOSFETs. Microelectronics Reliability 45(9-11): 1343-1348 (2005)
2003
9	EE	S. Djoric-Veljkovic, I. Manic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic: Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs. Microelectronics Reliability 43(9-11): 1455-1460 (2003)
2002
8	EE	Ninoslav Stojadinovic, Michael G. Pecht: Editorial. Microelectronics Reliability 42(4-5): 463 (2002)
7	EE	Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev: Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs. Microelectronics Reliability 42(4-5): 669-677 (2002)
6	EE	Ninoslav Stojadinovic: Dependability of Engineering Systems: J.M. Nahman, Springer-Verlag, Berlin, Heidelberg, New York, 2002, 192 pages. Microelectronics Reliability 42(6): 993 (2002)
5	EE	Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, D. Dankovic, S. Golubovic, S. Dimitrijev: Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. Microelectronics Reliability 42(9-11): 1465-1468 (2002)
2001
4	EE	Ninoslav Stojadinovic, Michael G. Pecht: Editorial. Microelectronics Reliability 41(1): 1 (2001)
3	EE	Ninoslav Stojadinovic: Understanding Semiconductor Devices; Sima Dimitrijev. Oxford University Press, New York. 2000. ISBN: 0-19-513186-X. Microelectronics Reliability 41(1): 142-143 (2001)
2	EE	Ninoslav Stojadinovic, Michael G. Pecht: In memory of D. Stewart Peck. Microelectronics Reliability 41(4): 481 (2001)
1		Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev: Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs. Microelectronics Reliability 41(9-10): 1373-1378 (2001)

Coauthor Index

1	D. Dankovic	[5] [10] [11] [12]
2	V. Davidovic	[1] [5] [7] [9] [10] [11] [12]
3	S. Dimitrijev	[1] [5] [7] [11]
4	S. Djoric-Veljkovic	[1] [5] [7] [9] [10] [11] [12]
5	S. Golubovic	[1] [5] [7] [9] [10] [11] [12]
6	I. Manic	[1] [5] [7] [9] [10] [11] [12]
7	Michael G. Pecht	[2] [4] [8]

Colors in the list of coauthors