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D. Dankovic

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2006
4EED. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic: NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectronics Reliability 46(9-11): 1828-1833 (2006)
2005
3EENinoslav Stojadinovic, I. Manic, V. Davidovic, D. Dankovic, S. Djoric-Veljkovic, S. Golubovic, S. Dimitrijev: Effects of electrical stressing in power VDMOSFETs. Microelectronics Reliability 45(1): 115-122 (2005)
2EENinoslav Stojadinovic, D. Dankovic, S. Djoric-Veljkovic, V. Davidovic, I. Manic, S. Golubovic: Negative bias temperature instability mechanisms in p-channel power VDMOSFETs. Microelectronics Reliability 45(9-11): 1343-1348 (2005)
2002
1EENinoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, D. Dankovic, S. Golubovic, S. Dimitrijev: Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. Microelectronics Reliability 42(9-11): 1465-1468 (2002)

Coauthor Index

1V. Davidovic [1] [2] [3] [4]
2S. Dimitrijev [1] [3]
3S. Djoric-Veljkovic [1] [2] [3] [4]
4S. Golubovic [1] [2] [3] [4]
5I. Manic [1] [2] [3] [4]
6Ninoslav Stojadinovic [1] [2] [3] [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)