D. Dankovic

2006
4	EE	D. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic: NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectronics Reliability 46(9-11): 1828-1833 (2006)
2005
3	EE	Ninoslav Stojadinovic, I. Manic, V. Davidovic, D. Dankovic, S. Djoric-Veljkovic, S. Golubovic, S. Dimitrijev: Effects of electrical stressing in power VDMOSFETs. Microelectronics Reliability 45(1): 115-122 (2005)
2	EE	Ninoslav Stojadinovic, D. Dankovic, S. Djoric-Veljkovic, V. Davidovic, I. Manic, S. Golubovic: Negative bias temperature instability mechanisms in p-channel power VDMOSFETs. Microelectronics Reliability 45(9-11): 1343-1348 (2005)
2002
1	EE	Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, D. Dankovic, S. Golubovic, S. Dimitrijev: Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. Microelectronics Reliability 42(9-11): 1465-1468 (2002)

Coauthor Index

1	V. Davidovic	[1] [2] [3] [4]
2	S. Dimitrijev	[1] [3]
3	S. Djoric-Veljkovic	[1] [2] [3] [4]
4	S. Golubovic	[1] [2] [3] [4]
5	I. Manic	[1] [2] [3] [4]
6	Ninoslav Stojadinovic	[1] [2] [3] [4]