| |
| 2001 | ||
|---|---|---|
| 2 | EE | R. Clerc, A. S. Spinelli, G. Ghibaudo, C. Leroux, G. Pananakakis: Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectronics Reliability 41(7): 1027-1030 (2001) |
| 1 | EE | P. O'Sullivan, R. Clerc, Kevin G. McCarthy, Alan Mathewson, G. Ghibaudo: Direct tunnelling models for circuit simulation. Microelectronics Reliability 41(7): 951-957 (2001) |
| 1 | G. Ghibaudo | [1] [2] |
| 2 | C. Leroux | [2] |
| 3 | Alan Mathewson | [1] |
| 4 | Kevin G. McCarthy | [1] |
| 5 | P. O'Sullivan | [1] |
| 6 | G. Pananakakis | [2] |
| 7 | A. S. Spinelli | [2] |