| |
| 2001 | ||
|---|---|---|
| 1 | EE | R. Clerc, A. S. Spinelli, G. Ghibaudo, C. Leroux, G. Pananakakis: Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectronics Reliability 41(7): 1027-1030 (2001) |
| 1 | R. Clerc | [1] |
| 2 | G. Ghibaudo | [1] |
| 3 | G. Pananakakis | [1] |
| 4 | A. S. Spinelli | [1] |