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2001 | ||
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1 | EE | R. Clerc, A. S. Spinelli, G. Ghibaudo, C. Leroux, G. Pananakakis: Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectronics Reliability 41(7): 1027-1030 (2001) |
1 | R. Clerc | [1] |
2 | G. Ghibaudo | [1] |
3 | G. Pananakakis | [1] |
4 | A. S. Spinelli | [1] |