| |
| 2005 | ||
|---|---|---|
| 1 | EE | Maxim Ershov, Sharad Saxena, Sean Minehane, P. Clifton, Mark Redford, R. Lindley, H. Karbasi, S. Graves, S. Winters: Degradation dynamics, recovery, and characterization of negative bias temperature instability. Microelectronics Reliability 45(1): 99-105 (2005) |
| 1 | Maxim Ershov | [1] |
| 2 | S. Graves | [1] |
| 3 | H. Karbasi | [1] |
| 4 | R. Lindley | [1] |
| 5 | Sean Minehane | [1] |
| 6 | Mark Redford | [1] |
| 7 | Sharad Saxena | [1] |
| 8 | S. Winters | [1] |