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Kenneth M. Wallquist

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1995
3 Kenneth M. Wallquist: On the Effect of ISSQ Testing in Reducing Early Failure Rate. ITC 1995: 910-915
2EEKenneth M. Wallquist: Achieving IDDQ/ISSQ Production Testing with QuiC-Mon. IEEE Design & Test of Computers 12(3): 62-69 (1995)
1993
1 Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins: A General Purpose IDDQ Measurement Circuit. ITC 1993: 642-651

Coauthor Index

1Charles F. Hawkins [1]
2Alan W. Righter [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)