Kenneth M. Wallquist

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1995

3 Kenneth M. Wallquist: On the Effect of I_SSQ Testing in Reducing Early Failure Rate. ITC 1995: 910-915

2 EE Kenneth M. Wallquist: Achieving IDDQ/ISSQ Production Testing with QuiC-Mon. IEEE Design & Test of Computers 12(3): 62-69 (1995)

1993

1 Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins: A General Purpose I_DDQ Measurement Circuit. ITC 1993: 642-651

1995
3		Kenneth M. Wallquist: On the Effect of I_SSQ Testing in Reducing Early Failure Rate. ITC 1995: 910-915
2	EE	Kenneth M. Wallquist: Achieving IDDQ/ISSQ Production Testing with QuiC-Mon. IEEE Design & Test of Computers 12(3): 62-69 (1995)
1993
1		Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins: A General Purpose I_DDQ Measurement Circuit. ITC 1993: 642-651

Coauthor Index

1 Charles F. Hawkins [1]

2 Alan W. Righter [1]