| 2004 |
|---|
| 4 | EE | Xiaogang Du,
Sudhakar M. Reddy,
Wu-Tung Cheng,
Joseph Rayhawk,
Nilanjan Mukherjee:
At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories.
VLSI Design 2004: 895-900 |
| 3 | EE | Xiaogang Du,
Sudhakar M. Reddy,
Don E. Ross,
Wu-Tung Cheng,
Joseph Rayhawk:
Memory BIST Using ESP.
VTS 2004: 243-248 |
| 2003 |
|---|
| 2 | EE | Xiaogang Du,
Sudhakar M. Reddy,
Joseph Rayhawk,
Wu-Tung Cheng:
Testing Delay Faults in Embedded CAMs.
Asian Test Symposium 2003: 378-383 |
| 1 | EE | Theo J. Powell,
Wu-Tung Cheng,
Joseph Rayhawk,
Omer Samman,
Paul Policke,
Sherry Lai:
BIST for Deep Submicron ASIC Memories with High Performance Application.
ITC 2003: 386-392 |
