| |
| 2004 | ||
|---|---|---|
| 3 | EE | Xiaogang Du, Sudhakar M. Reddy, Wu-Tung Cheng, Joseph Rayhawk, Nilanjan Mukherjee: At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories. VLSI Design 2004: 895-900 |
| 2 | EE | Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk: Memory BIST Using ESP. VTS 2004: 243-248 |
| 2003 | ||
| 1 | EE | Xiaogang Du, Sudhakar M. Reddy, Joseph Rayhawk, Wu-Tung Cheng: Testing Delay Faults in Embedded CAMs. Asian Test Symposium 2003: 378-383 |
| 1 | Wu-Tung Cheng | [1] [2] [3] |
| 2 | Nilanjan Mukherjee | [3] |
| 3 | Joseph Rayhawk | [1] [2] [3] |
| 4 | Sudhakar M. Reddy | [1] [2] [3] |
| 5 | Don E. Ross | [2] |