P. A. Stolk

2001
1	EE	B. J. O'Sullivan, P. K. Hurley, F. N. Cubaynes, P. A. Stolk, F. P. Widdershoven: Flat band voltage shift and oxide properties after rapid thermal annealing. Microelectronics Reliability 41(7): 1053-1056 (2001)

Coauthor Index

1	F. N. Cubaynes	[1]
2	P. K. Hurley	[1]
3	B. J. O'Sullivan	[1]
4	F. P. Widdershoven	[1]