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F. P. Widdershoven

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2001
1EEB. J. O'Sullivan, P. K. Hurley, F. N. Cubaynes, P. A. Stolk, F. P. Widdershoven: Flat band voltage shift and oxide properties after rapid thermal annealing. Microelectronics Reliability 41(7): 1053-1056 (2001)

Coauthor Index

1F. N. Cubaynes [1]
2P. K. Hurley [1]
3B. J. O'Sullivan [1]
4P. A. Stolk [1]

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