| 2008 |
|---|
| 9 | EE | Yanjing Li,
Samy Makar,
Subhasish Mitra:
CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns.
DATE 2008: 885-890 |
| 2002 |
|---|
| 8 | EE | Subhasish Mitra,
Edward J. McCluskey,
Samy Makar:
Design for Testability and Testing of IEEE 1149.1 Tap Controller.
VTS 2002: 247-252 |
| 1998 |
|---|
| 7 | EE | Samy Makar:
A layout-based approach for ordering scan chain flip-flops.
ITC 1998: 341-347 |
| 1997 |
|---|
| 6 | EE | Samy Makar,
Edward J. McCluskey:
ATPG for scan chain latches and flip-flops.
VTS 1997: 364-369 |
| 1995 |
|---|
| 5 | | Samy Makar,
Edward J. McCluskey:
Functional Tests for Scan Chain Latches.
ITC 1995: 606-615 |
| 4 | EE | Samy Makar,
Edward J. McCluskey:
Checking experiments to test latches.
VTS 1995: 196-201 |
| 3 | | Daniel Boley,
Gene H. Golub,
Samy Makar,
Nirmal R. Saxena,
Edward J. McCluskey:
Floating Point Fault Tolerance with Backward Error Assertions.
IEEE Trans. Computers 44(2): 302-311 (1995) |
| 1988 |
|---|
| 2 | | Samy Makar,
Edward J. McCluskey:
On the Testing of Multiplexers.
ITC 1988: 669-679 |
| 1 | EE | Edward J. McCluskey,
Samy Makar,
Samiha Mourad,
Kenneth D. Wagner:
Probability models for pseudorandom test sequences.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 68-74 (1988) |
