Yanjing Li
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2008
1
EE
Yanjing Li,
Samy Makar
,
Subhasish Mitra
: CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns.
DATE 2008
: 885-890
Coauthor
Index
1
Samy Makar
[
1
]
2
Subhasish Mitra
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
