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| 2003 | ||
|---|---|---|
| 1 | EE | Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, S. Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes: High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectronics Reliability 43(7): 1011-1020 (2003) |
| 1 | Guido Groeseneken | [1] |
| 2 | V. De Heyn | [1] |
| 3 | M. Natarajan Iyer | [1] |
| 4 | S. Jenei | [1] |
| 5 | H. E. Maes | [1] |
| 6 | Michiel Steyaert | [1] |
| 7 | S. Thijs | [1] |
| 8 | Vesselin K. Vassilev | [1] |