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| 2005 | ||
|---|---|---|
| 1 | EE | C. S. Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou: An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. Microelectronics Reliability 45(7-8): 1144-1149 (2005) |
| 1 | C. S. Ho | [1] |
| 2 | Juin J. Liou | [1] |
| 3 | Ming Tang | [1] |