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Kuo-Yin Huang

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2005
1EEC. S. Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou: An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. Microelectronics Reliability 45(7-8): 1144-1149 (2005)

Coauthor Index

1C. S. Ho [1]
2Juin J. Liou [1]
3Ming Tang [1]

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