Michael D. Ciletti

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9 Scott vpn Tonningen, Michael D. Ciletti: ADM: A New Technique for the Simulation of CMOS Circuit Transients. ISCAS 1995: 732-735
8EEWeiwei Mao, Michael D. Ciletti: Reducing correlation to improve coverage of delay faults in scan-path design. IEEE Trans. on CAD of Integrated Circuits and Systems 13(5): 638-646 (1994)
7 Weiwei Mao, Michael D. Ciletti: Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults. ITC 1992: 588-597
6EEWeiwei Mao, Michael D. Ciletti: Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage. DAC 1991: 73-79
5EEWeiwei Mao, Michael D. Ciletti: A Variable Observation Time Method for Testing Delay Faults. DAC 1990: 728-731
4 Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti: QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults. ICCAD 1990: 280-283
3EEWeiwei Mao, Michael D. Ciletti: DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation. IEEE Trans. on CAD of Integrated Circuits and Systems 9(8): 893-898 (1990)
2EEWeiwei Mao, Michael D. Ciletti: A Simplified Six-waveform Type Method for Delay Fault Testing. DAC 1989: 730-733
1EEWeiwei Mao, Michael D. Ciletti: Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation. DAC 1988: 591-596

Coauthor Index

1Deepak K. Goel [4]
2Ravi K. Gulati [4]
3Weiwei Mao [1] [2] [3] [4] [5] [6] [7] [8]
4Scott vpn Tonningen [9]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)