| |
| 2006 | ||
|---|---|---|
| 1 | EE | D. Alvarez, M. J. Abou-Khalil, C. Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, J. Li, C. Seguin, R. Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006) |
| 1 | M. J. Abou-Khalil | [1] |
| 2 | D. Alvarez | [1] |
| 3 | Kiran V. Chatty | [1] |
| 4 | Robert Gauthier | [1] |
| 5 | R. Halbach | [1] |
| 6 | D. Kontos | [1] |
| 7 | J. Li | [1] |
| 8 | C. Russ | [1] |