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R. Halbach

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2006
1EED. Alvarez, M. J. Abou-Khalil, C. Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, J. Li, C. Seguin, R. Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006)

Coauthor Index

1M. J. Abou-Khalil [1]
2D. Alvarez [1]
3Kiran V. Chatty [1]
4Robert Gauthier [1]
5D. Kontos [1]
6J. Li [1]
7C. Russ [1]
8C. Seguin [1]

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