X. Federspiel

2007
2	EE	S. Orain, J.-C. Barbé, X. Federspiel, P. Legallo, H. Jaouen: FEM-based method to determine mechanical stress evolution during process flow in microelectronics, application to stress-voiding. Microelectronics Reliability 47(2-3): 295-301 (2007)
2006
1	EE	S. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon: Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development. Microelectronics Reliability 46(9-11): 1530-1535 (2006)

Coauthor Index

1	J.-C. Barbé	[2]
2	N. Bicaïs-Lépinay	[1]
3	S. Courtas	[1]
4	M. Grégoire	[1]
5	H. Jaouen	[2]
6	P. Legallo	[2]
7	S. Orain	[2]
8	C. Wyon	[1]

Colors in the list of coauthors