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N. Bicaïs-Lépinay

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2006
2EES. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon: Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development. Microelectronics Reliability 46(9-11): 1530-1535 (2006)
2002
1EEN. Bicaïs-Lépinay, F. André, R. Pantel, S. Jullian, A. Margain, L. F. Tz. Kwakman: Lift-out techniques coupled with advanced TEM characterization methods for electrical failure analysis. Microelectronics Reliability 42(9-11): 1747-1752 (2002)

Coauthor Index

1F. André [1]
2S. Courtas [2]
3X. Federspiel [2]
4M. Grégoire [2]
5S. Jullian [1]
6L. F. Tz. Kwakman [1]
7A. Margain [1]
8R. Pantel [1]
9C. Wyon [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)