N. Bicaïs-Lépinay

2006
2	EE	S. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon: Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development. Microelectronics Reliability 46(9-11): 1530-1535 (2006)
2002
1	EE	N. Bicaïs-Lépinay, F. André, R. Pantel, S. Jullian, A. Margain, L. F. Tz. Kwakman: Lift-out techniques coupled with advanced TEM characterization methods for electrical failure analysis. Microelectronics Reliability 42(9-11): 1747-1752 (2002)

Coauthor Index

1	F. André	[1]
2	S. Courtas	[2]
3	X. Federspiel	[2]
4	M. Grégoire	[2]
5	S. Jullian	[1]
6	L. F. Tz. Kwakman	[1]
7	A. Margain	[1]
8	R. Pantel	[1]
9	C. Wyon	[2]

Colors in the list of coauthors