| |
| 2006 | ||
|---|---|---|
| 1 | EE | S. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon: Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development. Microelectronics Reliability 46(9-11): 1530-1535 (2006) |
| 1 | N. Bicaïs-Lépinay | [1] |
| 2 | S. Courtas | [1] |
| 3 | X. Federspiel | [1] |
| 4 | C. Wyon | [1] |