C. Wyon

2006
2	EE	S. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon: Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development. Microelectronics Reliability 46(9-11): 1530-1535 (2006)
2001
1	EE	G. Borsoni, N. Béchu, M. Gros-Jean, M. L. Korwin-Pawlowski, R. Laffitte, V. Le Roux, L. Vallier, N. Rochat, C. Wyon: Ultra-thin oxides on silicon fabricated using ultra-slow multicharged ion beams. Microelectronics Reliability 41(7): 1063-1066 (2001)

Coauthor Index

1	N. Béchu	[1]
2	N. Bicaïs-Lépinay	[2]
3	G. Borsoni	[1]
4	S. Courtas	[2]
5	X. Federspiel	[2]
6	M. Grégoire	[2]
7	M. Gros-Jean	[1]
8	M. L. Korwin-Pawlowski	[1]
9	R. Laffitte	[1]
10	N. Rochat	[1]
11	V. Le Roux	[1]
12	L. Vallier	[1]

Colors in the list of coauthors