2008 |
23 | EE | Gregory G. Slabaugh,
Gozde B. Unal,
Tong Fang,
Jarek Rossignac,
Brian Whited:
Variational Skinning of an Ordered Set of Discrete 2D Balls.
GMP 2008: 450-461 |
22 | EE | Yunqiang Chen,
Matthieu Maitre,
Tong Fang:
Transparent layer separation for dual energy imaging.
ICIP 2008: 821-824 |
21 | EE | Gozde B. Unal,
Delphine Nain,
Gregory G. Slabaugh,
Tong Fang:
Customized Design of Hearing Aids Using Statistical Shape Learning.
MICCAI (1) 2008: 518-526 |
20 | EE | Gozde B. Unal,
S. Bucher,
S. Carlier,
Gregory G. Slabaugh,
Tong Fang,
K. Tanaka:
Shape-Driven Segmentation of the Arterial Wall in Intravascular Ultrasound Images.
IEEE Transactions on Information Technology in Biomedicine 12(3): 335-347 (2008) |
2007 |
19 | EE | Yunqiang Chen,
Lin Cheng,
Tong Fang,
Rainer Raupach:
A Multi-Image Restoration Method for Image Reconstruction from Projections.
ICCV 2007: 1-8 |
18 | EE | Zhe Wang,
Gregory G. Slabaugh,
Gozde B. Unal,
Tong Fang:
Registration of Ultrasound Images Using an Information-Theoretic Feature Detector.
ISBI 2007: 736-739 |
17 | EE | Gregory G. Slabaugh,
Koon Kong,
Gozde B. Unal,
Tong Fang:
Variational Guidewire Tracking Using Phase Congruency.
MICCAI (2) 2007: 612-619 |
16 | EE | Zhe Wang,
Gregory G. Slabaugh,
Gozde B. Unal,
Mengchu Zhou,
Tong Fang:
An information-theoretic detector based scheme for registration of speckled medical images.
SMC 2007: 1026-1030 |
15 | EE | Ying Zhang,
Wei Xu,
Tong Fang:
Stochastic Hopf bifurcation and chaos of stochastic Bonhoeffer-van der Pol system via Chebyshev polynomial approximation.
Applied Mathematics and Computation 190(2): 1225-1236 (2007) |
14 | EE | Christopher V. Alvino,
Gozde B. Unal,
Gregory G. Slabaugh,
Bertrand Peny,
Tong Fang:
Efficient segmentation based on Eikonal and diffusion equations.
Int. J. Comput. Math. 84(9): 1309-1324 (2007) |
2006 |
13 | EE | Alexander Zouhar,
Tong Fang,
Gozde B. Unal,
Gregory G. Slabaugh,
Hui Xie,
Fred McBagonluri:
Anatomically-Aware, Automatic, and Fast Registration of 3D Ear Impression Models.
3DPVT 2006: 240-247 |
12 | EE | Gregory G. Slabaugh,
Gozde B. Unal,
Tong Fang,
Michael Wels:
Ultrasound-Specific Segmentation via Decorrelation and Statistical Region-Based Active Contours.
CVPR (1) 2006: 45-53 |
11 | EE | Hao Wu,
Yunqiang Chen,
Tong Fang:
Coupled Bayesian Framework for Dual Energy Image Registration.
CVPR (2) 2006: 2475-2482 |
10 | EE | Huy-Nam Doan,
Gregory G. Slabaugh,
Gozde B. Unal,
Tong Fang:
Semi-Automatic 3-D Segmentation of Anatomical Structures of Brain MRI Volumes using Graph Cuts.
ICIP 2006: 1913-1916 |
9 | EE | Hongcheng Wang,
Yunqiang Chen,
Tong Fang,
Jason Tyan,
Narendra Ahuja:
Gradient Adaptive Image Restoration and Enhancement.
ICIP 2006: 2893-2896 |
8 | EE | Gozde B. Unal,
Gregory G. Slabaugh,
Andreas Ess,
Anthony J. Yezzi,
Tong Fang,
Jason Tyan,
Martin Requardt,
Robert Krieg,
Ravi T. Seethamraju,
Mukesh Harisinghani,
Ralph Weissleder:
Semi-Automatic Lymph Node Segmentation in LN-MRI.
ICIP 2006: 77-80 |
7 | EE | Lin Cheng,
Yunqiang Chen,
Tong Fang,
Jason Tyan:
Fast Iterative Adaptive Reconstruction in Low-Dose CT Imaging.
ICIP 2006: 889-892 |
6 | EE | Bertrand Peny,
Gozde B. Unal,
Gregory G. Slabaugh,
Tong Fang,
Christopher V. Alvino:
Efficient and Robust Segmentations Based on Eikonal and Diffusion PDEs.
IWICPAS 2006: 339-348 |
5 | EE | Tong Fang,
Michael D. Osterman,
Michael G. Pecht:
Statistical analysis of tin whisker growth.
Microelectronics Reliability 46(5-6): 846-849 (2006) |
2005 |
4 | EE | Yunqiang Chen,
Hongcheng Wang,
Tong Fang,
Jason Tyan:
Mutual Information Regularized Bayesian Framework for Multiple Image Restoration.
ICCV 2005: 190-197 |
2003 |
3 | EE | Wei Xu,
Qun He,
Tong Fang,
Haiwu Rong:
Global Analysis of Stochastic bifurcation in Duffing System.
I. J. Bifurcation and Chaos 13(10): 3115-3123 (2003) |
2 | EE | Tong Fang,
Mohsen A. Jafari,
Stephen C. Danforth,
Ahmad Safari:
Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators.
Mach. Vis. Appl. 15(2): 63-75 (2003) |
1998 |
1 | | Tong Fang,
I. Bakhadyrov,
Mohsen A. Jafari,
G. Alpan:
On-Line Detection of Defects in Layered Manufacturing.
ICRA 1998: 254-259 |