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I. Bakhadyrov

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1998
1 Tong Fang, I. Bakhadyrov, Mohsen A. Jafari, G. Alpan: On-Line Detection of Defects in Layered Manufacturing. ICRA 1998: 254-259

Coauthor Index

1G. Alpan [1]
2Tong Fang [1]
3Mohsen A. Jafari [1]

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