I. Bakhadyrov
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1998
1
Tong Fang
, I. Bakhadyrov,
Mohsen A. Jafari
,
G. Alpan
: On-Line Detection of Defects in Layered Manufacturing.
ICRA 1998
: 254-259
Coauthor
Index
1
G. Alpan
[
1
]
2
Tong Fang
[
1
]
3
Mohsen A. Jafari
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
