| |
| 2002 | ||
|---|---|---|
| 1 | EE | W. Rahajandraibe, Christian Dufaza, Daniel Auvergne, B. Cialdella, B. Majoux, V. Chowdhury: Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications. DATE 2002: 316-321 |
| 1 | Daniel Auvergne | [1] |
| 2 | V. Chowdhury | [1] |
| 3 | Christian Dufaza | [1] |
| 4 | B. Majoux | [1] |
| 5 | W. Rahajandraibe | [1] |