| 2006 |
|---|
| 8 | EE | Ilias Pappas,
L. Nalpantidis,
Vasilios Kalenteridis,
Stilianos Siskos,
A. A. Hatzopoulos,
C. A. Dimitriadis:
A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs.
ISCAS 2006 |
| 7 | EE | N. P. Papadopoulos,
A. A. Hatzopoulos,
D. K. Papakostas,
C. A. Dimitriadis,
Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.
ISCAS 2006 |
| 6 | EE | N. P. Papadopoulos,
A. A. Hatzopoulos,
D. K. Papakostas,
C. A. Dimitriadis,
Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.
Microelectronics Journal 37(11): 1313-1320 (2006) |
| 5 | EE | D. H. Tassis,
A. T. Hatzopoulos,
N. Arpatzanis,
C. A. Dimitriadis,
G. Kamarinos:
Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.
Microelectronics Reliability 46(12): 2032-2037 (2006) |
| 4 | EE | A. T. Hatzopoulos,
D. H. Tassis,
N. Arpatzanis,
C. A. Dimitriadis,
G. Kamarinos:
Effects of hot carriers in offset gated polysilicon thin-film transistors.
Microelectronics Reliability 46(2-4): 311-316 (2006) |
| 2005 |
|---|
| 3 | EE | N. A. Hastas,
N. Archontas,
C. A. Dimitriadis,
G. Kamarinos,
T. Nikolaidis,
N. Georgoulas,
A. Thanailakis:
Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors.
Microelectronics Reliability 45(2): 341-348 (2005) |
| 2003 |
|---|
| 2 | EE | N. A. Hastas,
C. A. Dimitriadis,
J. Brini,
G. Kamarinos,
V. K. Gueorguiev,
S. Kaschieva:
Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors.
Microelectronics Reliability 43(1): 57-60 (2003) |
| 1 | EE | N. A. Hastas,
C. A. Dimitriadis,
F. V. Farmakis,
G. Kamarinos:
Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors.
Microelectronics Reliability 43(4): 671-674 (2003) |
