| |
| 2006 | ||
|---|---|---|
| 2 | EE | D. H. Tassis, A. T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos: Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. Microelectronics Reliability 46(12): 2032-2037 (2006) |
| 1 | EE | A. T. Hatzopoulos, D. H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos: Effects of hot carriers in offset gated polysilicon thin-film transistors. Microelectronics Reliability 46(2-4): 311-316 (2006) |
| 1 | C. A. Dimitriadis | [1] [2] |
| 2 | A. T. Hatzopoulos | [1] [2] |
| 3 | G. Kamarinos | [1] [2] |
| 4 | D. H. Tassis | [1] [2] |