| |
| 2005 | ||
|---|---|---|
| 1 | EE | N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, A. Thanailakis: Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors. Microelectronics Reliability 45(2): 341-348 (2005) |
| 1 | N. Archontas | [1] |
| 2 | C. A. Dimitriadis | [1] |
| 3 | N. Georgoulas | [1] |
| 4 | N. A. Hastas | [1] |
| 5 | G. Kamarinos | [1] |
| 6 | T. Nikolaidis | [1] |