| 2006 |
|---|
| 5 | EE | D. H. Tassis,
A. T. Hatzopoulos,
N. Arpatzanis,
C. A. Dimitriadis,
G. Kamarinos:
Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.
Microelectronics Reliability 46(12): 2032-2037 (2006) |
| 4 | EE | A. T. Hatzopoulos,
D. H. Tassis,
N. Arpatzanis,
C. A. Dimitriadis,
G. Kamarinos:
Effects of hot carriers in offset gated polysilicon thin-film transistors.
Microelectronics Reliability 46(2-4): 311-316 (2006) |
| 2005 |
|---|
| 3 | EE | N. A. Hastas,
N. Archontas,
C. A. Dimitriadis,
G. Kamarinos,
T. Nikolaidis,
N. Georgoulas,
A. Thanailakis:
Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors.
Microelectronics Reliability 45(2): 341-348 (2005) |
| 2003 |
|---|
| 2 | EE | N. A. Hastas,
C. A. Dimitriadis,
J. Brini,
G. Kamarinos,
V. K. Gueorguiev,
S. Kaschieva:
Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors.
Microelectronics Reliability 43(1): 57-60 (2003) |
| 1 | EE | N. A. Hastas,
C. A. Dimitriadis,
F. V. Farmakis,
G. Kamarinos:
Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors.
Microelectronics Reliability 43(4): 671-674 (2003) |
